Database of Zeolite Structures
 
Measured XRD Pattern for as-made SSZ-45 (EEI)


Data details
Data supplied by
Stef Smeets
Laboratory of Crystallography
ETH ZurichZurich (Switzerland)
Data collection
Instrument used: Materials Science Beamline, Swiss Light Source, Villigen, Switzerland (MYTHEN II detector)
Radiation: Synchrotron
Wavelength: 0.998220Å
Reference
"SSZ-45: a molecular sieve with large cavities and small pore openings"
Smeets, S., Xie, D., McCusker, L.B., Baerlocher, Ch., Zones, S.I., Thompson, J.A., Lacheen, H., Huang, H.-M.
Chem. Mater., 26, 3909-3913, (2014)
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Diffration data for as-made SSZ-45 as a text file
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