Database of Zeolite Structures
Measured XRD Pattern for ABN-Sigma-2 (SGT)

Data details
Data supplied by
Bernd Marler
Institut für Geologie, Mineralogie und Geophysik
Ruhr-Universität Bochum
D-44780 Bochum
Data collection
Instrument used: Siemens D5000 diffractometer with Johansson Ge(111) monochromator
Radiation: Cu K(alpha-1)
Wavelength: 1.540600Å
"Crystal Structure of the clathrasil Sigma-2 containing 3-azabicyclo[3.2.2]nonan as the guest molecule."
Grünewald-Lüke, A., Marler  B. and Gies  H.
New Crystal Structures, 4, 655-656, (2001)
Special Conditions
Borosilicate glass capillary
Data collected at 20K
Diffration data for ABN-Sigma-2 as a text file
Change wavelength for measured XRD pattern
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